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Updated: Jun 21, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Chemical identification of ions in doped NaCl by scanning force microscopy
Adam S Foster1, Clemens Barth, Claude R Henry
1Helsinki University of Technology, Laboratory of Physics, P.O. Box 1100, 02015 Helsinki, Finland.
Abstract:
A quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip's last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.
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