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Domain structure and phase symmetry of multiferroic BiFeO3-PbTiO3 single crystals studied by piezoresponse force

Wei-Min Zhu1, Hai-Yan Guo, Zuo-Guang Ye

  • 1Department of Chemistry and 4D LABS, Simon Fraser University, Burnaby, BC, V5A1S6 Canada.

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
|August 19, 2009
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...