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Updated: Jun 20, 2026
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Single-Particle Cryo-EM Data Collection with Stage Tilt using Leginon
Published on: July 1, 2022
Optimal tilt magnitude determination for aberration-corrected super resolution exit wave function reconstruction
S J Haigh1, H Sawada, Angus I Kirkland
1Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK.
Summary
Aberration-corrected transmission electron microscopy (TEM) achieves super-resolution imaging by using complementary beam tilts. This method improves resolution beyond instrumental limits, with sample properties becoming the main constraint.
Area of Science:
- Materials Science
- Physics
- Electron Microscopy
Background:
- Transmission electron microscopy (TEM) traditionally faces resolution limits due to spatial frequency transfer.
- Tilted illumination in TEM can transfer higher spatial frequencies, but this effect is directional.
Purpose of the Study:
- To determine the optimal experimental tilt magnitude for aperture synthesis in aberration-corrected TEM.
- To demonstrate super-resolution imaging capabilities in aberration-corrected TEM.
Main Methods:
- Utilized aperture synthesis with complementary beam tilts during exit wave function reconstruction.
- Acquired datasets of aberration-corrected TEM images at various beam tilt angles, including 18 mrad.
- Reconstructed exit wave functions from the acquired image datasets.
Main Results:
- Electron-optical aberration correction enables larger tilt angles and relaxes experimental constraints.
- Achieved a resolution improvement from 0.11 nm to better than 0.08 nm at 200 kV.
- Demonstrated that sample properties, not instrumental parameters, often limit achievable resolution.
Conclusions:
- Optimized tilt magnitude for aperture synthesis in aberration-corrected TEM.
- Super-resolution imaging is feasible, with resolution limited by the specimen rather than the microscope.
- Successfully reconstructed an exit wave function showcasing significant resolution enhancement.
