Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron

G Behan1, E C Cosgriff, Angus I Kirkland

  • 1Department of Materials, University of Oxford, Oxford OX1 3PH, UK.

Summary

Depth resolution in scanning transmission electron microscopy optical sectioning is limited by object size due to missing transfer function information. Three-dimensional imaging is possible for specific samples like nanoparticles with prior information.

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