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Laurence de Viguerie1, V Armando Sole, Philippe Walter

  • 1Centre de Recherche et de Restauration des Musées de France, C2RMF, Palais du Louvre, Porte des Lions, 14 quai François Mitterrand, 75001 Paris, France. laurence.deviguerie@culture.gouv.fr

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This study introduces a quantitative X-ray fluorescence spectrometry (XRF) method to analyze layered materials like paintings. The technique accurately determines elemental composition and layer thickness, crucial for art conservation.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Art Conservation Science

Background:

  • X-ray fluorescence spectrometry (XRF) is a non-destructive technique for elemental analysis, widely used in art and archaeology since the 1970s.
  • Quantitative analysis with XRF, especially for layered structures like paintings, presents challenges due to differential X-ray attenuation.
  • Modeling layer composition and thickness is essential for accurate interpretation of XRF data from complex samples.

Purpose of the Study:

  • To investigate the application of XRF with the fundamental parameters method for reconstructing the composition and thickness of layers in multilayered samples.
  • To evaluate the accuracy of this quantitative XRF approach for analyzing art objects.
  • To demonstrate the in situ applicability of the method for art historical research.

Main Methods:

  • Utilized X-ray fluorescence spectrometry (XRF) combined with the fundamental parameters method.
  • Employed differential X-ray attenuation principles to model the effects of multiple layers.
  • Tested the method on multilayered standards and an inhomogeneous painting sample.

Main Results:

  • The fundamental parameters method achieved a maximum error of 15% for thickness determination and 10% for concentration.
  • XRF analysis on an inhomogeneous painting sample yielded an accurate average composition.
  • The method was successfully applied in situ to estimate layer thicknesses on a painting by Marco d'Oggiono.

Conclusions:

  • Quantitative XRF using the fundamental parameters method is a viable approach for analyzing the layered composition and thickness of art objects.
  • The technique offers valuable insights for art conservation and historical analysis, even in challenging inhomogeneous samples.
  • In situ application demonstrates the practical utility of this advanced XRF analysis for cultural heritage research.