Atomic force microscopy observation of the enamel roughness and depth profile after phosphoric acid etching

Juan Pablo Loyola-Rodriguez1, Veronica Zavala-Alonso, Enrique Reyes-Vela

  • 1San Luis Potosi University, Av. Dr. Manuel Nava S/N, Zona Universitaria, CP 78290, San Luis Potosi, México. jloyola@uaslp.mx