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Updated: Jun 20, 2026
08:09
A Technique to Functionalize and Self-assemble Macroscopic Nanoparticle-ligand Monolayer Films onto Template-free Substrates
Published on: May 9, 2014
Optical reflectance technique for observations of submonolayer adsorbed films
Optics Letters
|August 28, 2009
Abstract:
An optical technique is described for detecting and measuring thicknesses of adsorbed films with subangstrom sensitivity. The technique relies on optical interference from an antireflecting thin-film structure that is predeposited on a transparent cell window: the reflectivity of the window depends linearly on the thickness of the molecular layer adsorbed from the gas in the cell.
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