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Updated: Jun 20, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
Confocal full-field X-ray microscope for novel three-dimensional X-ray imaging
Akihisa Takeuchi1, Yasuko Terada, Yoshio Suzuki
1SPring-8/Japan Synchrotron Radiation Research Institutes, Hyogo 679-5198, Japan. take@spring8.or.jp
Abstract:
A confocal full-field X-ray microscope has been developed for use as a novel three-dimensional X-ray imaging method. The system consists of an X-ray illuminating ;sheet-beam' whose beam shape is micrified only in one dimension, and an X-ray full-field microscope whose optical axis is normal to the illuminating sheet beam. An arbitral cross-sectional region of the object is irradiated by the sheet-beam, and secondary X-ray emission such as fluorescent X-rays from this region is imaged simultaneously using the full-field microscope. This system enables a virtual sliced image of a specimen to be obtained as a two-dimensional magnified image, and three-dimensional observation is available only by a linear translation of the object along the optical axis of the full-field microscope. A feasibility test has been carried out at beamline 37XU of SPring-8. Observation of the three-dimensional distribution of metallic inclusions in an artificial diamond was performed.
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