Phase Contrast and Differential Interference Contrast Microscopy
Interference and Diffraction
Infrared (IR) Spectroscopy: Overview
Total Internal Reflection Fluorescence Microscopy
NMR Spectrometers: Resolution and Error Correction
IR Spectrometers
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Updated: Jun 20, 2026

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
Published on: August 12, 2013
Kai Wicker1, Simon Sindbert, Rainer Heintzmann
1King's College London, Randall Division of Cell and Molecular Biology, Guy's Campus, New Hunt's House, London SE11UL, United Kingdom.
This study introduces a simple image inversion interferometer to improve scanning fluorescence microscopy resolution. The device uses reflections for enhanced lateral resolution and light efficiency in confocal laser scanning microscopy.
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