UV–Vis Spectrometers
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
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Updated: Apr 19, 2026

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
Published on: June 28, 2018
Hiroshi Okabe1, Masayuki Hayakawa, Junichi Matoba
1Core Technology Center, Omron Corporation, Kyoto 619-0283, Japan. hiroshi_okabe@omron.co.jp
A new compact channeled spectroscopic ellipsometer (CSE) prototype significantly reduces errors and maintains fast, 20 ms acquisition times. This advanced system accurately measures film thicknesses, enabling new applications requiring portability and speed.
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