Full-field modeling of the longitudinal electro-optic probe

Area of Science:

• Optics and Photonics
• Materials Science
• Electrical Engineering

Background:

• Spatially varying anisotropic perturbations cause optical polarization changes and mode coupling.
• These effects are significant in plane-wave and fiber mode propagation.
• Existing studies focus on specific propagation modes.

Purpose of the Study:

• To present a novel optical S-parameter analysis applicable to arbitrary optical field distributions.
• To evaluate the performance of longitudinal electro-optic probes for non-invasive examination of GaAs integrated circuits.
• To characterize measurement errors in electro-optic probes.

Main Methods:

• Development of a new optical S-parameter analysis technique.
• Application of the S-parameter analysis to electro-optic probe performance evaluation.
• Modeling the electro-optic probe as a scanned electro-optic spatial filter to analyze measurement errors.

Main Results:

• The S-parameter analysis provides a versatile tool for studying optical polarization changes.
• The method allows for accurate evaluation of longitudinal electro-optic probes.
• Measurement errors in circuit voltage distribution can be quantified using this approach.

Conclusions:

• The proposed S-parameter analysis offers a generalized method for understanding optical perturbations.
• This technique enhances the accuracy and reliability of non-invasive circuit examination.
• The study provides a framework for improving electro-optic probe design and application.