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Updated: Jun 20, 2026
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Measurement of Tension Release During Laser Induced Axon Lesion to Evaluate Axonal Adhesion to the Substrate at Piconewton and Millisecond Resolution
Published on: May 27, 2013
Picosecond time scale imaging of mechanical contacts
Thomas Dehoux1, Oliver B Wright, Roberto Li Voti
1Division of Applied Physics, Graduate School of Engineering, Hokkaido University, Sapporo 060-8628, Japan. dehouxthomas@yahoo.fr
Ultrasonics
|September 24, 2009
Summary
This study uses ultrafast opto-acoustics to precisely measure nanoindentation in chromium films. The technique reveals film deformation with sub-nanometer resolution, offering new insights into material properties.
Area of Science:
- Materials Science
- Nanotechnology
- Acoustics
Background:
- Nanoindentation is crucial for understanding thin film mechanical properties.
- High-resolution probing of deformation during nanoindentation is challenging.
- Opto-acoustic techniques offer potential for non-destructive material characterization.
Purpose of the Study:
- To investigate the nanoindentation behavior of thin chromium films on sapphire substrates.
- To demonstrate the capability of ultrafast opto-acoustic technique for high-resolution indentation profiling.
- To simultaneously achieve thermal wave imaging during nanoindentation.
Main Methods:
- Utilized an ultrafast opto-acoustic technique.
- Employed a ceramic ball bearing as the indenter.
- Probed film indentation profiles using acoustic pulses at approximately 40 GHz.
- Achieved thermal wave imaging at megahertz frequencies.
Main Results:
- Achieved sub-nanometer resolution in probing film indentation profiles.
- Resolved deformation of chromium films during loading.
- Characterized contact areas with radii of approximately 25 micrometers.
- Successfully integrated thermal wave imaging with nanoindentation analysis.
Conclusions:
- The ultrafast opto-acoustic technique provides unprecedented resolution for studying nanoindentation.
- This method enables detailed analysis of thin film deformation under load.
- The combined opto-acoustic and thermal wave approach offers a powerful tool for materials characterization.
