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Related Concept Videos

Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Related Experiment Video

Updated: Jun 20, 2026

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
12:14

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

Electronically scanned optical-fiber Young's white-light interferometer.

S Chen, A J Rogers, B T Meggitt

    Optics Letters
    |September 24, 2009
    PubMed
    Summary

    This study introduces a novel optical-fiber interferometer using low-coherent light, offering a simple design that minimizes spatial coherence mismatch for enhanced strain and temperature sensing applications.

    Area of Science:

    • Optics and Photonics
    • Fiber Optic Sensing
    • Interferometry

    Background:

    • Traditional white-light interferometers often suffer from spatial coherence mismatch, limiting their performance.
    • Electronic scanning in interferometers can introduce complexities and reduce accuracy.
    • Developing robust and simple fiber optic sensors is crucial for various industrial applications.

    Purpose of the Study:

    • To describe a new optical-fiber interferometer based on Young's classic setup.
    • To address the spatial coherence mismatch issue in electronically scanned white-light interferometers.
    • To demonstrate the sensor's capability for strain and temperature measurement.

    Main Methods:

    • An optical-fiber interferometer was designed using a low-coherent light source.

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    Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

    Published on: February 27, 2013

    Related Experiment Videos

    Last Updated: Jun 20, 2026

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
    12:14

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

    Published on: August 12, 2013

    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
    11:47

    Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

    Published on: February 27, 2013

  • A linear charge-coupled device (CCD) detector was employed for signal acquisition.
  • The interferometer's structure was optimized to reduce spatial coherence mismatch.
  • Main Results:

    • The developed interferometer exhibits a unique and simple structure.
    • Significant reduction in spatial coherence mismatch was achieved compared to other designs.
    • Experimental validation confirmed its effectiveness as a large dynamic range strain or temperature sensor.

    Conclusions:

    • The proposed optical-fiber interferometer offers a simplified and effective solution for white-light interferometry.
    • Its design overcomes key limitations of existing electronically scanned systems.
    • This technology holds promise for advanced fiber optic sensing applications, particularly for strain and temperature monitoring.