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Medipix 2 detector applied to low energy electron microscopy

R van Gastel1, I Sikharulidze, S Schramm

  • 1University of Twente, Institute for Nanotechnology, P.O. Box 217, NL-7500 AE Enschede, The Netherlands. R.vanGastel@utwente.nl

Ultramicroscopy
|October 14, 2009
PubMed

Insights

Solid-state hybrid pixel detectors, like Medipix 2, offer improved performance in low energy electron microscopy (LEEM) and photo-emission electron microscopy (PEEM). These advanced detectors enhance image contrast and resolution compared to traditional microchannel plates (MCPs).

Area of Science:

  • Materials Science
  • Physics
  • Microscopy Technology

Background:

  • Traditional detectors for Low Energy Electron Microscopy (LEEM) and Photo-Emission Electron Microscopy (PEEM), such as microchannel plates (MCPs), phosphor screens, and CCD cameras, are becoming performance limitations.
  • MCPs exhibit limitations that hinder advancements in LEEM and PEEM capabilities.

Purpose of the Study:

  • To evaluate the performance of a solid-state hybrid pixel detector, Medipix 2, as an alternative to traditional MCPs in LEEM and PEEM.
  • To demonstrate the potential of Medipix 2 for enhancing real-space imaging and spectroscopy in these microscopy techniques.

Main Methods:

  • Implementation and testing of the Medipix 2 detector in LEEM and PEEM experimental setups.
  • Comparative analysis of image contrast and resolution obtained with Medipix 2 versus traditional MCP detectors.

Main Results:

  • Medipix 2 demonstrated background-free operation and an effectively infinite dynamic range.
  • Significant enhancements in both image contrast and resolution were observed when using Medipix 2 compared to MCPs.
  • The Medipix 2 detector showed negligible aging at the electron energies relevant for LEEM and PEEM.

Conclusions:

  • The Medipix 2 solid-state hybrid pixel detector represents a significant advancement for LEEM and PEEM applications.
  • Its superior performance characteristics, including enhanced contrast, resolution, and durability, position it as a detector of choice for next-generation microscopy systems.

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