Error analysis of Cm measurement under the whole-cell patch-clamp recording

Hao Zhang1, Anlian Qu, Jie Luo

  • 1Institute of Biophysics and Biochemistry, College of Life Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, Hubei Province, People's Republic of China.

Summary

This study introduces a method to analyze errors in membrane capacitance (C(m)) measurements caused by residual fast capacitance (DeltaC(p)). Over-compensation of fast capacitance leads to more accurate C(m) estimates than under-compensation within optimal frequencies.