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Updated: Jun 19, 2026

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Published on: June 19, 2018
[Development of X-ray excited fluorescence spectrometer]
1Key Laboratory of Waves & Microstructure Materials, Bohr Institute of Solid State Physics, Tongji University, Shanghai 200092, China.
A new X-ray excited fluorescence spectrometer was developed for exploring scintillation materials. This instrument offers excellent wavelength resolution, stability, and safety, making it effective for material discovery.
Area of Science:
- Materials Science
- Spectroscopy
- Analytical Chemistry
Context:
- Development of advanced analytical instrumentation is crucial for materials discovery.
- X-ray excited fluorescence spectroscopy offers a powerful method for characterizing luminescent materials.
- Scintillation materials are vital for radiation detection and imaging applications.
Purpose:
- To develop and evaluate a novel X-ray excited fluorescence spectrometer.
- To calibrate the spectrometer's performance using standard lamps.
- To measure the X-ray excited emission spectra of barium fluoride (BaF2) and cesium iodide (CsI(Tl)) crystals.
Summary:
- An X-ray excited fluorescence spectrometer was constructed using an X-ray tube and a spectrometer.
- The apparatus underwent comprehensive evaluation, including calibration of wavelength and detection efficiency.
- Performance was assessed by measuring emission spectra of BaF2 and CsI(Tl) crystals.
Impact:
- The developed spectrometer demonstrates superior wavelength resolution, stability, and operational ease.
- It incorporates effective radiation protection measures.
- This instrument serves as a valuable tool for discovering and characterizing new scintillation materials.
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