Related Experiment Video
Updated: Aug 9, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Programable Beam Control for Electron Energy-Loss Spectroscopy and Ptychography
Mariana Palos1, Liam Spillane2, Geri Topore1
1Department of Materials, London Centre of Nanotechnology, Imperial College London, Exhibition Road, London SW7 2AZ, UK.
Abstract:
Programable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster trajectories, including spiral and multi-pass sequential patterns, on electron energy-loss spectroscopy (EELS) and ptychography. Using DyScO3 as a model perovskite, we compare spatial resolution, spectral fidelity, and artifact suppression across scan modes. Ptychographic phase reconstructions consistently achieve atomic resolution and remain robust to large jumps in probe position. In contrast, atomic-resolution EELS maps show pronounced sensitivity to probe motion, with sequential and spiral scans introducing non-uniform elemental contrast. Finally, spiral scanning applied under cryogenic conditions in BTO thin films improves dose uniformity and mitigates drift-related distortions. These results establish practical guidelines for the implementation of non-raster scan strategies in 4D-STEM and highlight the inherent resilience of ptychography to trajectory-induced artifacts.
Related Concept Videos
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Atomic Emission Spectroscopy: Lab
Atomic Emission Spectroscopy: Instrumentation
