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Fabrication of Silica Ultra High Quality Factor Microresonators
Published on: July 2, 2012
Ultimate Q of optical microsphere resonators
Optics Letters
|October 30, 2009
Summary
Researchers achieved a high quality factor (Q) of 0.8 x 10^10 in fused-silica microspheres, nearing fundamental material limits. They demonstrated monitoring of water adsorption
Area of Science:
- Optical physics
- Materials science
- Nanotechnology
Background:
- Whispering-gallery modes (WGMs) in dielectric microspheres exhibit extremely high quality factors (Q).
- Material properties and surface conditions critically influence Q, limiting performance in applications.
- Fused silica is a promising material for high-Q resonators due to low optical loss.
Purpose of the Study:
- To demonstrate ultra-high Q factors in fused-silica microspheres near fundamental material limits.
- To investigate the impact of atmospheric water adsorption on WGM Q factors and frequencies.
- To explore the potential for supermaterial Q factors by suppressing scattering losses.
Main Methods:
- Fabrication of fused-silica microspheres.
- Excitation and measurement of whispering-gallery modes at 633 nm.
- Monitoring of Q factor and frequency shifts over time to track adsorption kinetics.
- Analysis of scattering loss mechanisms in microspheres.
Main Results:
- Achieved a quality factor (Q) of (0.8 +/- 0.1) x 10^10, approaching the material's intrinsic limit.
- Demonstrated submonolayer sensitivity in monitoring atmospheric water adsorption kinetics via Q factor and frequency changes.
- Identified atmospheric water adsorption as the primary limitation for ultimate Q in these microspheres.
Conclusions:
- Fused-silica microspheres can achieve Q factors close to fundamental material attenuation limits.
- Whispering-gallery mode parameters are sensitive probes for surface adsorption phenomena.
- Suppression of scattering losses offers a pathway towards achieving supermaterial Q factors.

