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Updated: Jun 18, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Field-effect and frequency dependent transport in semiconductor-enriched single-wall carbon nanotube network device

Manu Jaiswal1, C S Suchand Sangeeth, Wei Wang

  • 1Department of Physics, Indian Institute of Science, Bangalore 560012, India.

Journal of Nanoscience and Nanotechnology
|November 14, 2009
PubMed

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