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Related Concept Videos

Raman Spectroscopy Instrumentation: Overview01:26

Raman Spectroscopy Instrumentation: Overview

A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...
Raman Spectroscopy: Overview01:20

Raman Spectroscopy: Overview

The underlying principle of Raman spectroscopy is based on the interaction between light and matter, specifically molecules' inelastic scattering of photons. When a monochromatic beam of light, typically from a laser source, interacts with a sample, most scattered light has the same frequency as the incident light. This is known as Rayleigh scattering.
However, a small fraction of the scattered light exhibits a frequency shift due to the exchange of energy between the incident photons and the...
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
UV–Vis Spectroscopy of Conjugated Systems01:32

UV–Vis Spectroscopy of Conjugated Systems

Organic compounds with conjugated double bonds show strong absorption features in the UV–visible region of the electromagnetic spectrum attributed to π → π* electronic excitations. Generally, a UV–vis absorption spectrum is recorded as a plot of absorbance vs wavelength. The wavelength of maximum absorbance, which manifests as a peak in the absorption spectrum, is denoted as λmax.
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Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview

Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
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Updated: Jun 18, 2026

Resolving Water, Proteins, and Lipids from In Vivo Confocal Raman Spectra of Stratum Corneum through a Chemometric Approach
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Published on: September 26, 2019

On optical depth profiling using confocal Raman spectroscopy.

N A Freebody1, A S Vaughan, A M Macdonald

  • 1School of Electronics and Computer Science, University of Southampton, Highfield, Southampton SO17 1BJ, UK.

Analytical and Bioanalytical Chemistry
|November 17, 2009
PubMed
Summary
This summary is machine-generated.

Confocal Raman spectroscopy depth profiling is better explained by photon scattering from an extended illuminated volume, not ray optics. Surface flatness is crucial for accurate depth profiling in materials, more so than refractive index matching.

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Area of Science:

  • Analytical Chemistry
  • Materials Science
  • Spectroscopy

Background:

  • Confocal Raman spectroscopy depth profiling was historically modeled using geometrical optics, leading to inaccuracies in understanding material profiles.
  • Previous attempts to refine Raman spectroscopy techniques failed to fully explain observed depth profiles and spectral characteristics.

Purpose of the Study:

  • To provide evidence for a photon scattering model over a ray optics approach for confocal Raman spectroscopy.
  • To develop a numerical model that accurately explains depth profiling in transparent and semicrystalline materials.

Main Methods:

  • Developed a numerical model incorporating surface refraction, bulk scattering attenuation, Raman scattering efficiency, and surface roughness.
  • Investigated the influence of surface flatness and refractive index matching on depth profiling accuracy.

Main Results:

  • The photon scattering model successfully explains depth profiling, including spectra from laminated samples and measurements above the focal point.
  • Surface roughness and flatness significantly impact depth profile accuracy, often more than refractive index matching with immersion oil.
  • Oil immersion objectives do not guarantee sampling only at the focal point due to scattering effects.

Conclusions:

  • A photon scattering model provides a more accurate understanding of confocal Raman spectroscopy depth profiling than traditional geometrical optics.
  • Surface preparation, specifically achieving flatness, is critical for high-quality Raman depth profiling of transparent and semicrystalline materials.
  • The findings challenge conventional assumptions about sample preparation requirements for Raman spectroscopy.