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Analysis of Contact Interfaces for Single GaN Nanowire Devices
Published on: November 15, 2013
Direct evidences of enhanced Ga interdiffusion in InAs vertically aligned free-standing nanowires
J C González1, A Malachias, R-Ribeiro Andrade
1Departamento de Física, Instituto de Ciências Exatas, Universidade Federal de Minas Gerais, Postal Code 702, 30123-970 Belo Horizonte, Brazil.
Abstract:
Direct evidences of enhanced Ga interdiffusion in InAs free-standing nanowires grown at moderate temperatures by molecular beam epitaxy on GaAs (111)B are presented in this work. Scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray diffraction measurements in coplanar and grazing incidence geometries show that nominally grown InAs NWs are actually made of an In0.86Ga0.14As alloy. Unlike typical vapor-liquid-solid growth, these nanowires are formed by diffusion-induced growth combined with strong interdiffusion from substrate material. Based on the experimental results, a simple nanowire growth model accounting for the Ga interdiffusion is also presented. This growth model could be generally applicable to the molecular beam heteroepitaxy of III-V nanowires.

