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Random parameter structure and the testlet model: extension of the Rasch testlet model.
Insu Paek1, Haniza Yon, Mark Wilson
1Harcourt Assessment, Educational Testing Service, Princeton, NJ 08541, USA. ipaek@ets.org
The extended Rasch testlet model (ET) performs similarly or better than the standard Rasch test model (RT) when testlet effects and target dimensions are correlated. ET offers improved accuracy in parameter estimation under these conditions.
Area of Science:
- Psychometrics
- Statistical modeling
- Educational measurement
Background:
- The Rasch testlet model (RT) assumes independence between testlet effects and the target dimension.
- Violations of this assumption can impact model performance and parameter estimation accuracy.
Purpose of the Study:
- To investigate the impact of violating the independence assumption in the Rasch testlet model (RT).
- To evaluate the performance of an extended Rasch testlet model (ET) that estimates the variance-covariance matrix without constraints.
Main Methods:
- Computer simulations were employed to compare the performance of RT and ET.
- The study focused on scenarios with correlated testlet effects and target dimensions.
Main Results:
- The extended Rasch testlet model (ET) demonstrated equal or superior performance compared to the standard Rasch testlet model (RT).
- The target dimension variance was the most affected parameter in RT, with bias increasing under high testlet effect and correlation.
- RT showed comparable performance to ET in estimating item and testlet effect parameters.
Conclusions:
- The extended Rasch testlet model (ET) provides a more robust approach when the independence assumption is violated.
- Accurate assessment of testlet effects relative to target dimensions can be challenging with the standard Rasch testlet model (RT) in certain real-world applications.
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