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Automated setpoint adjustment for biological contact mode atomic force microscopy imaging.

Ignacio Casuso1, Simon Scheuring

  • 1Institut Curie, Equipe INSERM Avenir, UMR168-CNRS, Paris, France.

Nanotechnology
|December 8, 2009
PubMed
Summary

This study introduces an automated method for atomic force microscopy (AFM) to maintain optimal imaging forces, preventing damage to biological samples. This technique enables high-resolution imaging of cells and membranes for extended periods without continuous operator intervention.

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...