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Related Experiment Video

Updated: Jun 17, 2026

High-definition Fourier Transform Infrared (FT-IR) Spectroscopic Imaging of Human Tissue Sections towards Improving Pathology

High-definition Fourier Transform Infrared (FT-IR) Spectroscopic Imaging of Human Tissue Sections towards Improving Pathology

Published on: January 21, 2015

Mid-infrared near-field spectroscopy.

Sergiu Amarie¹, Thomas Ganz, Fritz Keilmann

¹Max Planck Institute for Quantum Optics, Garching, Germany. samarie@rzg.mpg.de

|December 10, 2009

Summary

We combined infrared spectroscopy and microscopy to achieve high-resolution infrared spectra from nanoscale sample spots. This new technique offers a unique tool for background-free analysis and discriminating scattering artifacts.

Area of Science:

Spectroscopy
Microscopy
Nanotechnology

Background:

Scattering near-field microscopy (s-SNOM) enables nanoscale optical analysis.
Dispersive Fourier-transform infrared spectroscopy (FTIR) provides broadband spectral information.

Purpose of the Study:

To combine FTIR and s-SNOM for high-resolution infrared spectroscopy of small sample spots.
To develop a background-free technique for nanoscale optical analysis.
To demonstrate a novel method for discriminating scattering artifacts.

Main Methods:

Integration of dispersive FTIR with apertureless s-SNOM using an AFM cantilever in a Michelson interferometer.
Utilizing near-field phonon resonance of SiC for calibration and background verification.
Achieving simultaneous amplitude and phase spectral data acquisition.

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Main Results:

Demonstration of continuous infrared spectra from 20 nm sample spots with 6 cm(-1) spectral resolution.
Verification of background-free s-SNOM operation and determination of absolute scattering efficiency.
First evidence of free-induction decay from near-field coupled scatterers using broadband illumination.

Conclusions:

The combined FTIR and s-SNOM technique provides a powerful new tool for nanoscale infrared spectroscopy.
The method allows for background-free analysis and effective discrimination against scattering artifacts.
Observation of free-induction decay opens new avenues for studying near-field coupled systems.