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Related Concept Videos

Design Example01:23

Design Example

The innovation of touch-tone telephony revolutionized the telecommunications industry by replacing the traditional rotary dial with a dual-tone multi-frequency (DTMF) signaling system. This system uses a matrix-style keypad with buttons arranged in four rows and three columns, creating 12 distinct signals each assigned to a pair of frequencies. Each button press results in a simultaneous generation of two sinusoidal tones – one from a low-frequency group (697 to 941 Hz) and one from a...
IR Frequency Region: Fingerprint Region01:03

IR Frequency Region: Fingerprint Region

IR spectra are divided into two main regions: the diagnostic region and the fingerprint region. The diagnostic region of the spectrum lies above 1500 cm−1. The absorptions resulting from single-bond vibrations of the N–H, C–H, and O–H stretch at higher wavenumbers and appear on the left side of the spectrum. The stretching absorptions of the C≡C and C≡N occur between 2100–2300 cm−1. In contrast, those arising from stretching absorptions of the C=O, C=N, and C=C occur between 1600–1850 cm−1.
The...

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Area-based Image Analysis Algorithm for Quantification of Macrophage-fibroblast Cocultures
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Robust wafer identification recognition based on asterisk-shape filter and high-low score comparison method.

Wei-Chih Hsu1, Tsan-Ying Yu, Kuan-Liang Chen

  • 1Department of Computer and Communication, National Kaohsiung First University of Scienceand Technology, Kaohsiung, Taiwan.

Applied Optics
|December 17, 2009
PubMed
Summary

This study introduces a novel wafer ID recognition method using an asterisk-shape filter and template matching. The approach efficiently identifies wafer IDs, overcoming challenges like uneven lighting and irregular character spacing.

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Area of Science:

  • Semiconductor Manufacturing
  • Computer Vision
  • Optical Character Recognition

Background:

  • Wafer identification (wafer ID) is crucial for tracking semiconductor manufacturing processes.
  • Existing optical character recognition (OCR) methods struggle with unique wafer ID characteristics like irregular spacing and stroke variations.
  • Laser-scribed wafer IDs present challenges due to fixed orientation scratches and varying gray levels.

Purpose of the Study:

  • To develop an efficient and accurate wafer ID recognition scheme.
  • To address the limitations of traditional OCR methods in recognizing wafer IDs.
  • To overcome challenges posed by uneven luminance and irregular character features.

Main Methods:

  • A novel wafer ID recognition scheme utilizing an asterisk-shape filter and high-low score comparison.
  • Employing template matching combined with stroke analysis for character recognition.
  • No prior training required, unlike machine learning approaches like support vector machines.

Main Results:

  • The proposed scheme effectively segments and recognizes wafer IDs.
  • High performance in overcoming uneven luminance and irregular character spacing.
  • Demonstrated efficient and correct recognition of wafer IDs.

Conclusions:

  • The developed wafer ID recognition scheme offers a robust solution for semiconductor manufacturing.
  • The asterisk-shape filter and template-matching approach provide high accuracy without extensive training data.
  • This method enhances traceability in wafer processing.