Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a...

Area of Science:

• Materials Science
• Surface Analysis
• Analytical Chemistry

Background:

• Organic depth profiling is crucial for material characterization.
• Previous studies indicated sample cooling improves profiling depth.
• C(60) sputtering is a common technique for organic materials.

Purpose of the Study:

• To investigate methods for improving organic depth profiling quality.
• To evaluate the impact of sample cooling and rotation on C(60) sputtering.
• To enhance depth resolution and quantification in organic depth profiling.

Main Methods:

• Utilized multilayered reference samples within a Versailles project on Advanced Materials and Standards (VAMAS) interlaboratory study.
• Investigated the effects of sample cooling to sub-zero temperatures on sputtering yield and profiling depth.
• Introduced and assessed sample rotation during C(60) sputtering for organic depth profiling.

Main Results:

• Sample cooling to approximately -40 degrees C reduced initial sputtering yield and extended useful profiling depth.
• Further cooling enhanced profiling depth without further reduction in initial sputtering yield.
• Sample rotation maintained initial sputtering yield throughout the depth, improving depth resolution by minimizing ion-beam-induced topography.

Conclusions:

• Sample cooling and rotation are effective strategies to improve organic depth profiling quality.
• Constant sputtering yield, achieved through rotation, enables simpler quantification of organic depth profiling data.
• These advancements contribute to more reliable and accurate analysis of organic material surfaces.