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Published on: June 23, 2023
Simulation of scanning transmission electron microscope images on desktop computers
1Monash Centre for Electron Microscopy, Department of Materials Engineering, Monash University, Victoria 3800, Australia. christian.dwyer@mcem.monash.edu.au
Two strategies, optimal probe sampling and desktop graphics processing units, significantly reduce scanning transmission electron microscope (STEM) simulation times. These methods enable practical, faster STEM image simulations for atomic structures on personal computers.
Area of Science:
- Computational materials science
- Electron microscopy simulation
Background:
- Multislice simulations are crucial for interpreting scanning transmission electron microscope (STEM) images.
- High computational cost currently limits the routine use of these simulations for complex atomic structures.
Purpose of the Study:
- To present two independent strategies for accelerating multislice STEM image simulations.
- To enable practical, desktop-based simulation of STEM images for general atomic structures.
Main Methods:
- Implementation of optimal probe sampling for reduced data acquisition.
- Leveraging desktop graphics processing units (GPUs) for parallel computation.
Main Results:
- Significant reduction in computation time from days to hours.
- Strategies are applicable to both elastic and inelastic scattering STEM imaging.
- Minimal implementation effort required for optimal probe sampling.
Conclusions:
- Combined strategies drastically decrease STEM simulation time.
- Facilitates routine use of advanced STEM simulations on standard desktop computers.
- Enables more accessible and efficient analysis of atomic structures using STEM.
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