Determination of Crystal Structures
X-ray Crystallography
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Updated: Jun 17, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
1OSIRES Optical Engineering, Schillerstrasse 19, D-98693 Ilmenau, Germany. jb@osires.biz
This study presents a new computational method to speed up the analysis of 2D multilayer gratings. By leveraging 1D periodicity within layers, it significantly reduces computation time for rigorous coupled wave analysis (RCWA).
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