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Fast diffraction computation schema for multilayer crossed gratings containing layers with 1D periodicity.

Joerg Bischoff1

  • 1OSIRES Optical Engineering, Schillerstrasse 19, D-98693 Ilmenau, Germany. jb@osires.biz

Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|December 26, 2009
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This study presents a new computational method to speed up the analysis of 2D multilayer gratings. By leveraging 1D periodicity within layers, it significantly reduces computation time for rigorous coupled wave analysis (RCWA).

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Area of Science:

  • Optics and Photonics
  • Computational Electromagnetics
  • Nanophotonics

Background:

  • Modal methods like Rigorous Coupled Wave Analysis (RCWA) are computationally intensive for crossed gratings.
  • The primary bottleneck is solving eigenproblems for each layer in 2D multilayer gratings.
  • Even 1D periodic layers within a 2D structure often require full 2D analysis, slowing computation.

Purpose of the Study:

  • To develop a faster computational schema for analyzing 2D multilayer gratings.
  • To address the computational inefficiency of current modal methods for crossed gratings.
  • To accelerate the eigenproblem formulation and solution for 1D periodic layers within 2D structures.

Main Methods:

  • A novel computation schema is introduced that exploits the 1D periodicity of individual layers.
  • The method optimizes the eigenproblem solution for layers with unidirectional periodicity within a multilayer stack.
  • This approach integrates 1D layer analysis into the overall 2D multilayer grating solution.

Main Results:

  • Significant acceleration in the formulation and solution of eigenproblems for 1D periodic layers.
  • Considerable reduction in the total computation time for 2D multilayer gratings containing 1D layers.
  • Demonstrates a practical approach to overcome computational bottlenecks in grating analysis.

Conclusions:

  • The proposed schema offers a substantial speed-up for diffraction computations of 2D multilayer gratings.
  • This method enhances the efficiency of modal analysis techniques for complex grating structures.
  • It paves the way for more rapid design and analysis of photonic devices utilizing crossed gratings.