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Updated: Jun 17, 2026

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Yi-Hung Liu1, Chi-Kai Wang1, Yung Ting1
1Department of Mechanical Engineering, Chung Yuan Christian University, Chungli, 320, Taiwan.
This study introduces a Kernel Principal Component Analysis (KPCA) method for automatic optical inspection (AOI) in thin-film transistor liquid-crystal display (TFT-LCD) manufacturing. The novel scheme achieves over 99% defect detection and 96% classification rates, significantly improving LCD panel yield.
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