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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Updated: Jun 17, 2026

Scattering And Absorption of Light in Planetary Regoliths
11:34

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

Scatter from X-ray Reflecting Surfaces.

J B Schroeder, R G Klimasewski

    Applied Optics
    |January 14, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study measured x-ray scatter on various surfaces. Fused silica showed the least scatter, while beryllium exhibited the most, offering crucial data for optical material selection.

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    Published on: June 19, 2018

    Area of Science:

    • Materials Science
    • Optics
    • Surface Metrology

    Background:

    • X-ray reflecting surfaces are critical components in various scientific instruments.
    • Understanding surface scatter is essential for optimizing optical performance and data quality.
    • Variations in material properties significantly influence scatter characteristics.

    Purpose of the Study:

    • To develop and apply a technique for measuring the relative scatter of different x-ray reflecting surfaces.
    • To quantitatively compare the scatter performance of common optical materials used in x-ray applications.

    Main Methods:

    • A novel technique was employed to measure relative scatter.
    • Scatter measurements were systematically performed on six distinct materials: fused silica, Cer-Vit, beryllium, Kanigen, steel, and silicon.

    Main Results:

    • Fused silica surfaces demonstrated the lowest scatter values among the tested materials.
    • Beryllium surfaces exhibited the highest scatter, approximately four times greater than fused silica.
    • Kanigen, steel, silicon, and Cer-Vit showed intermediate scatter, roughly double that of fused silica.

    Conclusions:

    • Fused silica is the preferred material for minimizing x-ray scatter in optical applications.
    • Beryllium is less suitable for applications demanding low scatter due to its high scattering properties.
    • The findings provide valuable data for selecting appropriate materials based on scatter requirements in x-ray optics.