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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

A technique in ellipsometry for measuring the thickness of a nonabsorbing film on a nonabsorbing substrate

D Hemming

    Applied Optics
    |January 15, 2010
    PubMed
    Abstract

    No abstract available in PubMed .

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