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Updated: Jun 17, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

Monitoring of thin film thickness by ellipsometry

R S Sirohi

    Applied Optics
    |January 15, 2010
    PubMed
    Abstract

    No abstract available in PubMed .

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