Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Overview of Microscopy Techniques

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Supernetwork-based efficient mapping of deep learning applications to mixed-precision hardware using model adaptation.

Nature communications·2026

Same author

Analogue speech recognition based on physical computing.

Nature·2025

Same author

Training of physical neural networks.

Nature·2025

Same author

Phase-Change Memory for In-Memory Computing.

Chemical reviews·2025

Same author

The growing memristor industry.

Nature·2025

Same author

The inherent adversarial robustness of analog in-memory computing.

Nature communications·2025

Same journal

Quantitative Mechanism Separation of Single-Event Transients in Nanosheet Transistors via TCAD Simulation.

Nanotechnology·2026

Same journal

Antibacterial, mechanical and curing properties of PMMA bone cement loaded with copper nanoparticles.

Nanotechnology·2026

Same journal

Deep learning-enabled self-powered bimodal flexible sensor for intelligent access control.

Nanotechnology·2026

Same journal

Thickness-Dependent Decoupling Charge Transport and NH 3 Sensing in Multilayer MoS 2 Transistors.

Nanotechnology·2026

Same journal

Symmetry-Based Tight-Binding Hamiltonian for Monolayer 1T'-MoS 2 : Spin Textures and Spin-Resolved Transport in Nanoribbons.

Nanotechnology·2026

Same journal

Compact Modeling of Pd-MoS2 Self-rectifying RRAM based on modulated Schottky barrier equation.

Nanotechnology·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Jun 17, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

High-throughput intermittent-contact scanning probe microscopy.

Deepak R Sahoo¹, Walter Häberle, Abu Sebastian

¹IBM Research-Zürich, CH-8803 Rüschlikon, Switzerland.

|January 19, 2010

Summary

This summary is machine-generated.

This study introduces a new intermittent-contact mode for micro-cantilever arrays, enabling high-speed imaging and reducing wear in applications like life sciences and semiconductor metrology.

More Related Videos

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions

Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions

Published on: June 14, 2016

Related Experiment Videos

Last Updated: Jun 17, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions

Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions

Published on: June 14, 2016

Area of Science:

Nanotechnology
Surface Science
Metrology

Background:

High-throughput applications in life sciences, nanofabrication, and semiconductor metrology rely on large arrays of micro-cantilevers.
Existing methods face challenges in speed and wear during operation.

Purpose of the Study:

To present a novel intermittent-contact mode operation for micro-cantilever arrays.
To enhance high-frequency operation and minimize tip-sample interaction forces and wear.

Main Methods:

Electrostatic actuation of micro-cantilevers with small oscillation amplitudes.
Utilizing input shaping of the actuation signal for reliable high-speed operation.
Sampling deflection signals once per oscillation cycle for high-speed imaging.

Main Results:

Demonstrated the efficacy of the proposed intermittent-contact mode.
Maintained tip diameter over 140 m of tip travel during continuous high-speed imaging.
Reduced tip and sample wear due to minimized interaction forces.

Conclusions:

The novel intermittent-contact mode offers a viable solution for high-throughput micro-cantilever applications.
This method significantly improves imaging speed and operational longevity.
It is suitable for demanding applications requiring precise nanoscale measurements.