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Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
09:51

Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries

Published on: April 22, 2013

Site-specific atomic scale analysis of solute segregation to a coincidence site lattice grain boundary

Mitra L Taheri1, Jason T Sebastian, Bryan W Reed

  • 1Drexel University, Department of Materials Science & Engineering, Philadelphia, PA 19104, USA. mtaheri@coe.drexel.edu

Ultramicroscopy
|January 26, 2010
PubMed

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