Note: Aligned deposition and modal characterization of micron and submicron poly(methyl methacyrlate) fiber

Amrinder S Nain1, Sinan Filiz, O Burak Ozdoganlar

  • 1Department of Mechanical Engineering and Institute for Complex Engineered Systems, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, USA. nain@vt.edu

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