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Experimental demonstration of coherence effects and linearity in microdensitometry
Applied Optics
|February 4, 2010
Summary
Standard microdensitometers are nonlinear. A new linear microdensitometer was developed, overcoming spatial frequency limitations and improving measurement accuracy for photographic film transmittance.
Area of Science:
- Optical Physics
- Metrology
- Image Science
Background:
- Microdensitometer measurements of photographic film transmittance at high spatial frequencies reveal inherent nonlinearity.
- Instrument response is influenced by spatial frequency and illumination mode, impacting measurement accuracy.
Purpose of the Study:
- To investigate the nonlinear behavior of conventional microdensitometers.
- To develop and demonstrate a linear microdensitometer for accurate high spatial frequency measurements.
- To characterize spatial coherence in microdensitometry.
Main Methods:
- Utilized a Wollaston prism shearing interferometer to measure spatial coherence in typical microdensitometers.
- Developed a linear microdensitometer that bypasses the imaging step and collects all transmitted light.
- Employed a cw laser source and microscope objectives on an optical bench for instrument assembly and testing.
Main Results:
- Documented the presence of partial coherence in microdensitometers, affecting measurements.
- Demonstrated that the linear microdensitometer's spatial frequency response is limited only by the scanning spot size.
- Verified linearity through edge width measurements and flat response to a phase edge.
Conclusions:
- Conventional microdensitometers exhibit nonlinearities due to partial coherence, limiting their accuracy at high spatial frequencies.
- The developed linear microdensitometer offers improved performance by avoiding imaging and collecting all transmitted light.
- This linear system provides a more accurate method for analyzing photographic film transmittance, especially at high spatial frequencies.

