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Related Experiment Video

Updated: Jun 16, 2026

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Published on: July 21, 2018

Surface-plasmon-coupled emission microscopy with a spiral phase plate.

Wai Teng Tang¹, Euiheon Chung, Yang-Hyo Kim

¹Computation and Systems Biology, Singapore-MIT Alliance, National University of Singapore, 4 Engineering Drive 3,Singapore 117576, Singapore.

|February 18, 2010

Summary

A spiral phase plate corrects distorted microscope images, enhancing surface imaging sensitivity and resolution. This simple modification improves image quality by converting a donut-shaped point-spread function into a single-lobed one.

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Area of Science:

Optics and Photonics
Microscopy
Surface Science

Background:

Surface plasmon-coupled emission (SPCE) microscopy offers high sensitivity for surface imaging.
A key limitation is the distorted, donut-shaped point-spread function (PSF), hindering detailed imaging.
Effective PSF correction is crucial for advancing SPCE microscopy applications.

Purpose of the Study:

To develop and validate a simple method for correcting the distorted PSF in SPCE microscopy.
To improve the lateral resolution and image quality of SPCE microscopy systems.
To enhance the utility of SPCE microscopy for sensitive surface imaging.

Main Methods:

Introduction of a spiral phase plate into the SPCE microscope optical path.
Characterization of the modified system's optical performance.
Comparison of the corrected PSF with the original donut-shaped PSF and with published data.

Main Results:

The spiral phase plate effectively converted the donut-shaped PSF into a single-lobed PSF.
This modification resulted in a significant improvement in image quality.
A lateral resolution enhancement of more than twofold was achieved.

Conclusions:

The spiral phase plate is an effective and simple solution for correcting PSF distortion in SPCE microscopy.
This technique enhances lateral resolution, making SPCE microscopy more powerful for surface imaging.
The improved optical performance opens new possibilities for nanoscale surface analysis.