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A Reusable, Low-profile, Cryogenic Wire Seal.

M D Stewart¹, G Koutroulakis, N Kalechofsky

¹Deptartment of Physics, Brown University, Providence, RI 02912.

|February 18, 2010

Summary

A novel Indium wire seal offers a compact, reusable solution for ultra-high vacuum applications. This design achieves exceptional leak tightness across a wide temperature range, from room temperature down to millikelvin (mK).

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Area of Science:

Materials Science
Vacuum Technology
Cryogenics

Background:

Achieving and maintaining ultra-high vacuum (UHV) is critical for many scientific experiments and technological applications.
Traditional sealing methods can be bulky, single-use, or inadequate at cryogenic temperatures.

Purpose of the Study:

To present the design of a novel, reusable Indium wire seal.
To demonstrate its capability for achieving and maintaining UHV conditions.
To validate its performance across a broad temperature spectrum.

Main Methods:

Design and fabrication of a compact Indium wire o-ring seal.
Integration with a screw-cap mechanism for controlled compression.
Leak rate testing using standard methods from room temperature down to millikelvin (mK) temperatures.

Main Results:

The Indium wire seal exhibits a small profile, facilitating integration into space-constrained systems.
Achieved leak tightness superior to 1x10(-10) std. cc/sec.
Demonstrated reliable sealing performance across the tested temperature range, including cryogenic conditions.

Conclusions:

The developed Indium wire seal provides a robust, reusable, and high-performance sealing solution for UHV and cryogenic applications.
Its design offers a practical alternative to conventional sealing methods, enhancing experimental capabilities.
The seal's performance validates its suitability for demanding scientific and industrial environments.