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Hemi-ellipsoidal mirror infrared reflectometer: development and operation.

B E Wood, J G Pipes, A M Smith

|February 19, 2010

Summary

This summary is machine-generated.

A new hemi-ellipsoidal mirror reflectometer (HEMR) accurately measures infrared hemispherical-directional reflectance for various materials. This instrument is functional for diverse sample types across a 2-34 micrometer wavelength range.

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Area of Science:

Optical Engineering
Materials Science
Spectroscopy

Background:

Accurate measurement of optical properties is crucial for material characterization.
Existing reflectometry methods may have limitations in spectral range or measurement geometry.
Hemispherical-directional reflectance provides comprehensive optical behavior data.

Purpose of the Study:

To develop and test a novel hemi-ellipsoidal mirror reflectometer (HEMR).
To enable measurement of hemispherical-directional reflectance in the infrared spectrum (2-34 micrometers).
To validate the instrument's performance with various sample types.

Main Methods:

Design and construction of a hemi-ellipsoidal mirror reflectometer (HEMR).
Operation over a wavelength interval of 2-34 micrometers.
Measurement of sample reflectance relative to a specular gold-coated reference surface.

Main Results:

The HEMR system was successfully developed and tested.
Experimental results demonstrate the HEMR is functional with tolerable errors for suitable source and sample areas.
Hemispherical-directional reflectance data were obtained for black paints, gold diffuser, sulfur, and cesium iodide from 2-34 micrometers.

Conclusions:

The developed HEMR is a viable instrument for measuring hemispherical-directional reflectance in the mid-to-far infrared.
The instrument provides reliable optical property data for diverse materials.
The presented data serve as a valuable resource for infrared optical studies.