Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Eccentricity of an Ellipse01:27

Eccentricity of an Ellipse

An ellipse is a fundamental conic section defined by the constant sum of distances from any point on its curve to two fixed points, known as the foci. This geometric property can be physically demonstrated using a pencil, string, and two pins. By anchoring the string at both ends and maintaining it taut with a pencil, one can trace the outline of an ellipse.The shape and extent of the ellipse are determined by its eccentricity, e, defined as the ratio of the distance between the center and a...
Common Leveling Mistakes and Errors01:17

Common Leveling Mistakes and Errors

A survey team is tasked with determining the elevation difference between points Point A and Point B, separated by uneven terrain. They use a leveling instrument and a leveling rod.Common MistakesMisreading the Rod: During a backsight reading at Point A, the instrumentman observes the rod partially obscured by tall grass. Instead of reading 1.135 m, they mistakenly record 1.735 m due to the misalignment of the crosshair with the wrong graduation. This error adds 0.600 m to all subsequent...
Ellipses01:30

Ellipses

An ellipse is formed when a right circular cone is intersected by an inclined plane that does not cut through its base. This intersection yields a closed, symmetric curve characterized by distinctive geometric properties. Most notably, an ellipse is defined as the collection of all points in a plane for which the combined distances to two fixed points—called the foci—remain constant.The ellipse features two principal axes: the major and the minor axes. The major axis is the longest diameter,...
Distance Corrections01:15

Distance Corrections

To achieve precise distance measurements, especially in surveying and construction, certain corrections must be applied to account for potential sources of error like the standardization errors, temperature variations, and slope adjustments.Standardization error emerges when measurement equipment undergoes changes, such as wear, repairs, or weather impacts. To address this, surveyors compare the equipment’s readings to a standard. This process identifies any deviation that might lead to...
Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Parent versus child donor perceptions of the bone marrow donation experience.

Bone marrow transplantation·2017
Same author

A review of the genetic and long-term effects of G-CSF injections in healthy donors: a reassuring lack of evidence for the development of haematological malignancies.

Bone marrow transplantation·2015
Same author

Infusion of autologous peripheral blood stem cells in an unrelated donor who developed severe aplastic anemia following stem cell donation.

Bone marrow transplantation·2011
Same author

WMDA guidelines for subsequent donations following initial BM or PBSCs.

Bone marrow transplantation·2011
Same author

Infrared quarter-wave reflection retarders designed with high-spatial-frequency dielectric surface-relief gratings on a gold substrate at oblique incidence.

Applied optics·2010
Same author

Determination of the refractive index and thickness of transparent pellicles by use of the polarization-independent absentee-layer condition.

Applied optics·2010
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Related Experiment Video

Updated: Jun 16, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

Ellipsometer nulling: convergence and speed.

D L Confer, R M Azzam, N M Bashara

    Applied Optics
    |February 19, 2010
    PubMed
    Summary
    This summary is machine-generated.

    Ellipsometry nulling is visualized by tracking polarization states (XPC) and (XSA). The study simplifies nulling criteria for isotropic reflectors by analyzing state trajectories in the complex plane.

    More Related Videos

    Experimental and Data Analysis Workflow for Soft Matter Nanoindentation
    13:04

    Experimental and Data Analysis Workflow for Soft Matter Nanoindentation

    Published on: January 18, 2022

    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
    10:21

    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces

    Published on: July 26, 2016

    Related Experiment Videos

    Last Updated: Jun 16, 2026

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
    09:32

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

    Published on: January 26, 2016

    Experimental and Data Analysis Workflow for Soft Matter Nanoindentation
    13:04

    Experimental and Data Analysis Workflow for Soft Matter Nanoindentation

    Published on: January 18, 2022

    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
    10:21

    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces

    Published on: July 26, 2016

    Area of Science:

    • Optical physics
    • Materials science
    • Surface analysis

    Background:

    • Ellipsometry is a powerful optical technique for characterizing thin films and surfaces.
    • Nulling is a critical step in ellipsometry to determine sample properties.
    • Understanding polarization state evolution is key to optimizing ellipsometric measurements.

    Purpose of the Study:

    • To graphically analyze the nulling process in ellipsometry.
    • To visualize the trajectories of key polarization states: polarizer-compensator (XPC) and specimen-analyzer (XSA).
    • To develop criteria for rapid nulling, particularly for isotropic reflectors.

    Main Methods:

    • Graphical analysis of polarization state trajectories in the complex plane.
    • Systematic variation of azimuth angles for ellipsometer elements.
    • Mathematical analysis of the specimen-analyzer (XSA) trajectory for isotropic reflectors.

    Main Results:

    • The nulling process is characterized by the convergence of (XPC) and (XSA) trajectories.
    • At null, the polarization states are matched: (XPC) = (XSA).
    • The (XSA) trajectory is a straight line for isotropic reflectors, simplifying nulling optimization.

    Conclusions:

    • Graphical tracking of polarization states provides a clear understanding of ellipsometry nulling.
    • The identified straight-line trajectory for isotropic reflectors enables efficient nulling procedures.
    • This study offers a simplified approach to optimizing ellipsometric measurements for specific sample types.