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Updated: Jun 16, 2026

Fabrication of Schottky Diodes on Zn-polar BeMgZnO/ZnO Heterostructure Grown by Plasma-assisted Molecular Beam Epitaxy
Published on: October 23, 2018
ZnO nanowire-embedded Schottky diode for effective UV detection by the barrier reduction effect
Joondong Kim1, Ju-Hyung Yun, Chang Hyun Kim
1Nano-Mechanical Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Daejeon, Korea. joonkim@kimm.re.kr
Abstract:
A zinc oxide nanowire (ZnO NW)-embedded Schottky diode was fabricated for UV detection. Two types of devices were prepared. The ZnO NW was positioned onto asymmetric metal electrodes (Al and Pt) for a Schottky device or symmetric metal electrodes (Al and Al) for an ohmic device, respectively. The Schottky device provided a rectifying current flow and was more sensitive to UV illumination than the ohmic device. The Schottky barrier plays an important role for UV detection by a UV-induced barrier reduction effect. The fabrication of the ZnO NW-embedded Schottky diode and the UV reaction mechanism are discussed in light of the UV light-induced Schottky barrier reduction effect.
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