Mass Analyzers: Common Types
Scanning Electron Microscopy
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Updated: Jun 15, 2026

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
Published on: March 29, 2016
K Tsumori1, M Osakabe, Y Takeiri
1National Institute for Fusion Science, 322-6 Oroshi, Toki, Gifu 509-5292, Japan. tsumori@nifs.ac.jp
This study monitored multibeamlets using infrared imaging. Optimal divergence angles for single beamlets were determined to be 4.1 mrad horizontally and 6.1 mrad vertically.
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