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Updated: May 24, 2026

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
Published on: April 29, 2020
Electron density measurement of cesium seeded negative ion source by surface wave probe
M Kisaki1, K Tsumori, H Nakano
1National Institute for Fusion Science, Toki 509-5292, Japan. kisaki.masashi@LHD.nifs.ac.jp
Abstract:
Electron density measurements of a large-scaled negative ion source were carried out with a surface wave probe. By comparison of the electron densities determined with the surface wave probe and a Langmuir probe, it was confirmed that the surface wave probe is highly available for diagnostic of the electron density in H(-) ion sources. In addition, it was found that the ratio of the electron density to the H(-) ion density dramatically decreases with increase of a bias voltage and the H(-) ions become dominant negative particles at the bias voltage of more than 6 V.
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