Development of a laser-focused ion beam combination machine.

Y Yoshida1, T Masuzawa, H Ikeda

  • 1Bio-Nano Electronics Research Center, Toyo University, 2100 Kujirai, Kawagoe, Saitama 350-8585, Japan. yyoshida@toyonet.toyo.ac.jp

Summary

A novel laser and focused ion beam (FIB) system achieves ultrafine precision for optical and micromedical devices. This advanced technology significantly reduces surface roughness, enabling high-quality microfabrication.

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