Nondestructive analysis of coated periodic nanostructures from optical data

T H Ghong1, S-H Han, J-M Chung

  • 1Nano-optical Property Laboratory and Department of Physics, Kyung Hee University, Seoul 130-701, Korea.

Optics Letters
|March 3, 2010
PubMed
Summary

This study enhances rigorous coupled-wave analysis for optical nondestructive measurements of integrated circuit structures. The method accurately determines oxide layer thicknesses in complex, multi-layered periodic structures.

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