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Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview

Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
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Updated: Jun 15, 2026

A Stable Phantom Material for Optical and Acoustic Imaging
04:54

A Stable Phantom Material for Optical and Acoustic Imaging

Published on: June 16, 2023

Refractive index determination using reflectance extrema.

C M Horwitz

    Applied Optics
    |March 4, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study presents contours for determining the refractive index (n) and extinction coefficient (k) of thin films. These contours allow for unique determination of film properties from reflectance and transmittance measurements.

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    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
    09:32

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

    Published on: January 26, 2016

    Area of Science:

    • Materials Science
    • Optics
    • Thin Film Physics

    Background:

    • Optical properties of thin films are crucial for device performance.
    • Determining the complex refractive index (n - ik) and thickness of thin films is essential for material characterization.
    • Existing methods can be complex and require specific measurement conditions.

    Purpose of the Study:

    • To develop a method for uniquely determining the refractive index (n) and extinction coefficient (k) of thin films.
    • To provide contours that relate optical properties (reflectance and transmittance) to film characteristics.
    • To extend the applicability of these contours to scattering films.

    Main Methods:

    • Calculation of contours of n and k versus reflectance (R) and transmittance (T) for thin films on a glass substrate.
    • Utilizing normal incidence R and T values at reflectance extrema, wavelength, and interference order.
    • Correction for substrate rear-surface reflectance and wavelength shifts of extrema.
    • Application of a simple model for strongly scattering films.

    Main Results:

    • Contours provide unique values for (n - ik) and film thickness.
    • The method covers a range of n = 1.6-4 and k = 0-1.
    • The approach is applicable to both non-scattering and strongly scattering thin films.
    • n and k retain their usefulness even in the presence of scattering.

    Conclusions:

    • The presented contours offer a straightforward method for thin film characterization.
    • This technique is valuable for determining optical constants and thickness from R and T measurements.
    • The method's extension to scattering films broadens its practical utility in materials science and optics.