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Related Concept Videos

IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview

Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
The ATR process begins by directing a beam...
Raman Spectroscopy Instrumentation: Overview01:26

Raman Spectroscopy Instrumentation: Overview

A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
UV–Vis Spectrometers01:14

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...
Uncertainty in Measurement: Reading Instruments02:46

Uncertainty in Measurement: Reading Instruments

Counting is the type of measurement that is free from uncertainty, provided the number of objects being counted does not change during the process. Such measurements result in exact numbers. By counting the eggs in a carton, for instance, one can determine exactly how many eggs are there in the carton. Similarly, the numbers of defined quantities are also exact. For example, 1 foot is exactly 12 inches, 1 inch is exactly 2.54 centimeters, and 1 gram is exactly 0.001 kilograms. Quantities...

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Related Experiment Video

Updated: Jun 15, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
09:10

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements

Published on: December 5, 2025

Versatile high-precision multiple-pass reflectometer.

O Arnon, P Baumeister

    Applied Optics
    |March 6, 2010
    PubMed
    Summary

    High-precision confocal mirror assemblies achieve over 0.99 radiant reflectance. Multilayer dielectric mirrors made of tantalum pentoxide and silica demonstrated a maximum reflectance of 0.9996 at 520 nm.

    Area of Science:

    • Optics and Photonics
    • Materials Science

    Background:

    • Accurate measurement of high reflectance is crucial for optical systems.
    • Existing methods may lack precision for near-perfect reflectors.

    Purpose of the Study:

    • To develop and validate a confocal mirror assembly for precise measurement of high radiant reflectances.
    • To characterize the performance of multilayer dielectric mirrors.

    Main Methods:

    • Utilized a confocal mirror assembly for reflectance measurements.
    • Fabricated multilayer dielectric reflectors using vacuum evaporation with alternating tantalum pentoxide and silica layers.
    • Tested mirrors with plano and curved surfaces at incidence angles from 5 to 70 degrees.

    Main Results:

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  • Achieved precise measurements of radiant reflectances exceeding 0.99.
  • Measured a maximum reflectance of 0.9996 +/- 0.0002 at 520 nm.
  • Demonstrated capability for both plano and curved mirrors across a range of incidence angles.

    • Conclusions:

    • The confocal mirror assembly provides high-precision measurements for advanced optical components.
    • Tantalum pentoxide/silica multilayer dielectric mirrors exhibit excellent performance for high-reflectance applications.