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Silicon vidicon system for measuring laser intensity profiles
Applied Optics
|March 9, 2010
Summary
This study introduces a rapid silicon-target vidicon system for analyzing laser beam profiles. The system offers high sensitivity uniformity and dynamic range, outperforming traditional film methods for laser analysis.
Area of Science:
- Optics and Photonics
- Laser Technology
- Materials Science
Background:
- Accurate characterization of laser beam intensity profiles is crucial for various scientific and industrial applications.
- Traditional methods like photographic film can be slow and have limitations in dynamic range and uniformity.
- Developing rapid, high-fidelity diagnostic tools for laser systems is an ongoing need.
Purpose of the Study:
- To describe a novel silicon-target vidicon and minicomputer system for real-time laser beam intensity profile analysis.
- To evaluate the system's performance, including sensitivity, dynamic range, and accuracy, for neodymium laser pulses.
- To compare the vidicon system's capabilities against conventional photographic techniques.
Main Methods:
- A silicon-target vidicon coupled with a minicomputer was employed for data acquisition and processing.
- Modifications were made to commercial cameras for linearized output and timing control.
- Laser beam profiles were recorded using a video disk recorder, digitized, and stored on magnetic disks for analysis.
- Neutron-transmutation-doped silicon targets were utilized to minimize spatial nonuniformities and interference.
Main Results:
- The system demonstrated high sensitivity uniformity (93% peak-to-peak over 9.6 mm) and a linear dynamic range exceeding 20.
- Absolute flux agreement within +/-10% was achieved, with peak energy flux analysis completed within 100 seconds post-laser pulse.
- The vidicon system showed superior performance compared to photographic film techniques in terms of speed and uniformity.
Conclusions:
- The developed silicon-target vidicon system provides rapid, accurate, and reliable measurement of laser beam intensity profiles.
- The system's enhanced uniformity and dynamic range make it a valuable alternative to photographic methods.
- This technology is adaptable for various laser wavelengths, pulse durations, and non-laser applications requiring intensity profile analysis.
