Atomic Force Microscopy
Overview of Microscopy Techniques
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 15, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
1School of Electrical and Electronics Engineering, Nanyang Technological University, Singapore, Singapore.
This study introduces a new method for precisely measuring probe-sample distance in atomic force microscopy (AFM). The technique accurately estimates separation using harmonic analysis, even with noisy data.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: