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Updated: Jun 15, 2026

Synthesis and Characterization of High c-axis ZnO Thin Film by Plasma Enhanced Chemical Vapor Deposition System and its UV Photodetector Application
08:18

Synthesis and Characterization of High c-axis ZnO Thin Film by Plasma Enhanced Chemical Vapor Deposition System and its UV Photodetector Application

Published on: October 3, 2015

Refractive index of ZnSe at 3.8 microm and 10.6 microm, from 80 K to 300 K

C J Thompson, A G Debell, W L Wolfe

    Applied Optics
    |March 10, 2010
    PubMed
    Abstract

    No abstract available in PubMed .

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